NTEK Group
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HALT (Highly Accelerated Life Test) is a process for discovering design defects. By applying stepwise increasing accelerated environmental stresses, it rapidly exposes the defects and weak points of test specimens. The exposed defects and failures are then analyzed and improved in terms of design, process and materials, so as to improve reliability. Its key feature is the application of environmental stresses beyond the design operating limits of the specimen, so that the time to expose failures is much shorter than that required under normal reliability stress conditions.
1) Rapidly identify weak points in product design and manufacturing processes.
2) Help increase the design margin of products.
3) Effectively improve product reliability.
4) Save design time and costs.
5) Help eliminate product design problems.
6) Help evaluate changes in product design.
1) There are no pass/fail criteria;
2) All specimens must be tested to failure;
3) Specimens must be monitored in real time during testing;
4) Any problem found during testing must be analyzed to determine the cause of failure;
5) The test results cannot be used to quantify product reliability.
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