NTEK Group
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High-low temperature testing mainly covers electrical and electronic products, their components and other materials. The severity of the test depends on the high and low temperatures and the test duration. High and low temperatures may cause a product to overheat, affecting safety and reliability in use, or even damaging it, for example:
· Differences in the coefficients of expansion of various materials cause bonding and migration between materials
· Changes in material properties
· Degradation of the electrical performance of components
· Reduced elasticity or mechanical strength of elastic elements, shortening product service life
· Accelerated deterioration and ageing of polymer and insulating materials, shortening product service life.
· Reduced elasticity of flexible materials such as rubber, resulting in cracking;
· Increased brittleness of metals and plastics, leading to fracture or cracking;
· Materials become brittle - for example, plastics and steel are prone to brittle fracture at low temperature, and rubber increases in hardness and loses elasticity
and so on.
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