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Shenzhen NTEK Testing Technology Co., Ltd.

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Hot Line 400-800-6106
NTEK Group
Tel:+86 18926052263 Email:ntek@ntek.org.cn No.24,Xinfa East Road,Xinqiao Street,Baoan District,Shenzhen

Micro-Drop Testing

Test Overview

The dual-station micro-drop test can perform partial reliability functional testing on small electronic products. The micro-drop test uses pneumatic fixtures to hold the test sample, which is driven by a motor to rise to the set drop height, simulating repeated drop testing of the product.


Micro-Drop Testing

Application Scope

Micro-drop testing is applicable to small consumer electronic products such as mobile phones, POS machines, tablets, Bluetooth speakers, telephone handsets, walkie-talkies, USB flash drives and learning machines. It meets the drop testing requirements for the edges, corners and faces of samples and supports both automatic and manual operation.

Test Principle

First, place the product (e.g. a mobile phone) into the drop fixture and adjust it to the proper size and position. The stepper motor drives the vacuum suction cup to pick up the phone, which is then released after rising, allowing the phone to fall freely. This process is repeated until the set number of drops is reached.

Test Methods

Four drop modes: directional drop, free fall, repeated drop and tumble drum drop.
For products such as mobile phones, insert a SIM card into the sample and assemble the battery so the phone is in normal working condition. Place the sample on the vertical drop tester, set the height to 1.0 m, and perform the vertical drop test. Each face is tested twice, for a total of 12 drops. After the drop test, first inspect the appearance, function and structure of the sample, record the test status, and then disassemble it for further inspection.


Insert a SIM card into the test sample and assemble the battery so the phone is in normal working condition. Place the sample in a 0.5 m tumble drum drop tester for drop testing. Inspect the appearance, function and structure of the phone every 50 drops, for a cumulative total of 300 drop cycles. After the test, inspect the function, structure and assembly of the phone (disassembly inspection is required).

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